大拱桥--暨南大学学生门户 » 图书馆 » 搜索包含 United States. Advisory Group on Electron Devices 的图书(共1969本)

The state of the nation's ecosystems : measuring the lands, waters, and living resources of the United States

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索取号：X508.712/E20041
作者：
出版社：Cambridge ; New York : Cambridge University Press, 2002.

The optoelectronics data book for design engineers

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索取号：TN202-62/E801.2
作者：Texas Instruments Incorporated. Semiconductor Group.、
出版社：Dallas, Tex. : Texas Instruments, 1975.

Developments in electron microscopy and analysis, 1977 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held in Glasgow, 12-14 September 1977 (EMAG 77)

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索取号：TN153-53/E803/1977
作者：
出版社：Bristol : Institute of Physics, 1977.

Scanning electron microscopy, 1972 : IIT research institute Chicago, Illinois 60616 USA

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索取号：TN153-53/E804/1972
作者：Illinois Institute of Technology. Research Institute.、Johari、 Om.、Corvin、 Irene.、
出版社：Chicago, Ill. : IITRI, 1972.

Seventh National Conference on Electron Probe Analysis

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索取号：TN146.8-53/E801/7
作者：National Conference on Electron Probe Analysis (7th : 1972 : San Francisco)、Electron Probe Analysis Society of America.、
出版社：Pittsburgh : L. Vassamillet, Carnegie-Mellon University, [1972?]

Sixth national conference on electron probe analysis : July 27-30, 1971

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索取号：TN146.8-53/E801/6
作者：National Conference on Electron Probe Analysis (6th : 1971 : Pittsburgh、 Pennsylvania)、Electron Probe Analysis Society of America.、
出版社：Pittsburgh, Pennsylvania : Pittsburgh Hilton Hotel, 1971.

Conference record of 1974 Conference on Display Devices and Systems : papers presented at the Statler Hilton, New York City, October 9-10, 1974

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索取号：TN141-53/E801/1974
作者：Conference on Display Devices and Systems (1974 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、Society for Information Display.、United States. Advisory Group on Electron Devices.、
出版社：[New York, N.Y. : Institute of Electrical and Electronics Engineers], c1975.

Microelectronic devices and circuits

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索取号：TN4/E993
作者：Fonstad、 Clifton G.、
出版社：New York : McGraw-Hill, c1994.

Record of the 11th Symposium on Electron, Ion, and Laser Beam Technology : Boulder, Colorado, 12-14 May 1971

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索取号：TN14-53/E801/11
作者：Symposium on Electron、 Ion、 and Laser Beam Technology (11th : 1971 : University of Colorado)、Thornley、 R. F. M. (Richard Frank Maute)、 1933-、IEEE Group on Electron Devices.、American Vacuum Society.、University of Colorado (Boulder campus)、
出版社：San Francisco, Calif. : San Francisco Press, c1971.

Record of the 10th symposium on electron, ion, and laser beam technology

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索取号：TN14-53/E801/10
作者：IEEE Symposium on Electron、 Ion、 and Laser Beam Technology (10th : 1969 : Gaithersburg、 Md.)、Marton、 L. (Ladislaus)、 1901-、Institute of Electrical and Electronics Engineers.、American Vacuum Society.、University of Maryland、 College Park.、United States. National Bureau of Standards.、
出版社：San Francisco : San Francisco Press, [c1969].

IEEE conference record of 1973 Conference on Electron Device Techniques : papers presented at the Hotel Belmont-Plaza, New York City, May 1-2, 1973

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索取号：TN102-53/E801/11
作者：Conference on Electron Device Techniques (11th : 1973 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、
出版社：New York, N.Y. : IEEE, c1973.

Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973

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索取号：TN06-53/E801/11
作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.

Reliability physics 1972 : 10th annual proceedings, Las Vegas, Nevada, April 5-7, 1972

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索取号：TN06-53/E801/10
作者：International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.

Reliability physics 1971 : 9th annual proceedings, Las Vegas, Nevada, March 31-April 2, 1971

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索取号：TN06-53/E801/9
作者：International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.

Proceedings of the International Topical Conference on Electron Beam Research and Technology, November 3-6, 1975, Albuquerque, New Mexico

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索取号：TN1-53/E805
作者：International Topical Conference on Electron Beam Research and Technology、 Albuquerque、 N. M.、 1975.、Yonas、 Gerold.、Sandia Laboratories.、United States. Energy Research and Development Administration.、
出版社：[Albuquerque, N.M.] : Sandia Laboratories ; Springfield, Va. : available from National Technical Information Service, U.S. Dept. of Commerce, 1976.

1972 IEEE - GMTT International Microwave Symposium : Digest of technical papers, May 22-24, 1972, Arlington Park Towers Hotel, Arlington Heights, IL

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索取号：TN019.2/E806/1972
作者：IEEE-GMTT International Microwave Symposium (1972 : Arlington Heights、 IL).、Book、 Eric G.、Institute of Electrical and Electronics Engineers.、IEEE Microwave Theory and Techniques Group.、
出版社：New York : Institute of Electrical and Electronics Engineers, 1972.